Fluke Corporation MET/CAL Procedure ============================================================================= INSTRUMENT: Fluke 8025B: (1 year) CAL VER /5100,5205,5220,8842 DATE: 03-Feb-95 AUTHOR: Fluke Corporation REVISION: $Revision: 2.6 $ ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 29 NUMBER OF LINES: 200 CONFIGURATION: Fluke 5100B CONFIGURATION: Fluke 5205A CONFIGURATION: Fluke 5220A CONFIGURATION: Fluke 8506A CONFIGURATION: Fluke 8842A ============================================================================= # # Source: # T.O. 33A1-12-1300-1 # Fluke 8025B instruction manual (PN 824482 Feb. 1988, Errata No. 3, 1/91). # # Compatibility: # MET/CAL 4.0 or later # # Subprocedures: # None # # Required Files: # None # # System Specifications: # TUR calculation is based on specification interval of the accuracy file. # The default 5100B accuracy file contains 6 month specs. # # Fluke makes no warranty, expressed or implied, as to the fitness # or suitability of this procedure in the customer's application. # # The 6 month specifications of the 5100B are used in TUR computations. # STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R P F W 1.002 ASK+ K 1.003 HEAD PRELIMINARY INSTRUCTIONS 1.004 DISP [32] WARNING 1.004 DISP HIGH VOLTAGE is used or exposed during the performance 1.004 DISP of this calibration. DEATH ON CONTACT may result if 1.004 DISP personnel fail to observe safety precautions. 1.005 HEAD {DISPLAY TEST} 1.006 DISP Turn the UUT on. 1.006 DISP AS the UUT is turned ON, verify that all display 1.006 DISP segments momentarily light up. 1.007 EVAL Did the UUT display test pass? 2.001 DISP Allow the UUT to stabilize at: 2.001 DISP Ambient temperature: 18C - 28C. 2.001 DISP Relative humidity: less than 80%. 2.002 HEAD {DIODE TEST} 2.003 DISP Select the DIODE Function. 2.004 EVAL Is the UUT displaying the {overload indicator} (OL)? 3.001 5100 0.090V 0.002U O 2W 4.001 5100 0.090V O S 2W 4.002 EVAL Is the {beeper on}? 5.001 5100 0.110V O S 2W 5.002 EVAL Is the {beeper off}? 6.001 ASK- N 6.002 MESS Slowly decrease the stimulus to 0.6V. 6.002 MESS Verify that the meter produces a short beep as the 6.002 MESS voltage descends through 0.7V (diode threshold). 6.003 5100 1.000V E N 2W 6.004 MESS 6.005 EVAL Did the meter produce a short beep through 0.7V? 7.001 HEAD {DC VOLTAGE TESTS} 7.002 DISP Select the DCV Function. 7.003 HEAD DC VOLTAGE TESTS: {3.2V Range} 7.004 5100 3.2 2.700V 0.003U 2W 8.001 HEAD DC VOLTAGE TESTS: {32V Range} 8.002 5100 32 27.00V 0.03U 2W 9.001 HEAD DC VOLTAGE TESTS: {320V Range} 9.002 5100 320 250.0V 0.3U 2W 10.001 HEAD DC VOLTAGE TESTS: {1000V Range} 10.002 5100 1000 1000V 2U 2W 11.001 HEAD {AC VOLTAGE TESTS} 11.002 DISP Select the ACV Function. 11.003 HEAD AC VOLTAGE TESTS: {3.2V Range} 11.004 5100 3.2 2.700V 0.016U 100H 2W 12.001 HEAD AC VOLTAGE TESTS: {32V Range} 12.002 5100 32 27.00V 0.57U 10kH 2W 13.001 DISP Disconnect the 5100B from the UUT. 13.002 DISP Connect the 5205A and UUT as follows: 13.002 DISP [32] 5205A OUTPUT HI to UUT V Ohm Diode 13.002 DISP [32] 5205A OUTPUT LO to UUT COM 13.003 HEAD AC VOLTAGE TESTS: {320V Range} 13.004 5205 320 250.0V 5.3U 10kH 2W 14.001 HEAD AC VOLTAGE TESTS: {1000V Range} 14.002 5205 1000 1000V 33U 10kH 2W 15.001 DISP Disconnect the 5205A from the UUT. 15.002 ASK- N U 15.003 HEAD {RESISTANCE TESTS} 15.004 DISP Select the Ohms Function. 15.005 HEAD {RESISTANCE TESTS} 15.006 DISP Select the Ohms Function. 15.007 DISP Configure the 8842A as follows: 15.007 DISP [32] 8842A INPUT HI to 8842A SENSE HI 15.007 DISP [32] 8842A INPUT LO to 8842A SENSE LO 15.008 IEEE [@8842]G5[I] 15.009 MATH MEM1 = MEM - 1100 15.010 JMPF 15.013 15.011 DISP Select FRONT INPUTS on the 8842A. 15.012 JMP 15.008 15.013 DISP Connect the 5100B OUTPUT to the 8842A INPUT. 15.014 RESF 100Z S 2W 15.015 8842 100Z N 4W 15.016 MATH M[1] = MEM 15.017 RESF 1kZ S 2W 15.018 8842 1kZ N 4W 15.019 MATH M[2] = MEM 15.020 RESF 10kZ S 2W 15.021 8842 10kZ N 4W 15.022 MATH M[3] = MEM 15.023 RESF * S 15.024 DISP Disconnect the leads from the 8842A and connect them to 15.024 DISP the UUT. 15.025 HEAD RESISTANCE TESTS: {320 Ohm Range} 15.026 RESF 100.0Z S 2W 15.027 ASK+ N U 15.028 MATH MEM = M[1] # 8842A 90 day accuracy, 200 Ohm Range 15.029 ACC Z 0.007% 0.004U 15.030 MEMI Enter UUT reading in Ohms: 15.031 MEME 15.032 MEMC 320 Z 0.5U 16.001 ASK- U 16.002 HEAD RESISTANCE TESTS: {3.2 kOhm Range} 16.003 RESF 1.000kZ S 2W 16.004 ASK+ U 16.005 MATH MEM = M[2] # 8842A 90 day accuracy, 2 kOhm Range 16.006 ACC kZ .005% .00003U 16.007 MEMI Enter UUT reading in kilohms: 16.008 MEME 16.009 MEMC 3.2 kZ 0.003U 17.001 ASK- U 17.002 HEAD RESISTANCE TESTS: {32 kOhm Range} 17.003 RESF 10.00kZ S 2W 17.004 ASK+ U 17.005 MATH MEM = M[3] # 8842A 90 day accuracy, 20 kOhm Range 17.006 ACC kZ .005% .0003U 17.007 MEMI Enter UUT reading in kilohms: 17.008 MEME 17.009 MEMC 32 kZ 0.03U 18.001 HEAD RESISTANCE TESTS: {320 kOhm Range} 18.002 RESF 320 100.0kZ 0.3U 2W 19.001 HEAD RESISTANCE TESTS: {3.2 MOhm Range} 19.002 RESF 3.2 1.000MZ 0.003U 2W 20.001 HEAD RESISTANCE TESTS: {32 MOhm Range} 20.002 RESF 32 10.00MZ 0.11U 2W 21.001 DISP Disconnect the 5100B from the UUT. 21.002 ASK- U 21.003 HEAD {CONDUCTANCE TEST} 21.004 DISP Select the nS function by repeatedly pressing 21.004 DISP the RANGE button until the nS annunciator 21.004 DISP appears at the right side of the display. 21.005 HEAD CONDUCTANCE TEST: {32nS Range} 21.006 ACC 0.00nY TOL 21.007 MEMI Enter UUT reading in nanosiemens: 21.008 MEME 21.009 MEMC 32 nY 0.10U 22.001 ASK+ U 22.002 HEAD {AC MILLIAMP TESTS} 22.003 DISP Select the AC mA/A Function. 22.004 DISP Connect the 5100B and UUT as follows: 22.004 DISP [32] 5100B OUTPUT HI to UUT mA/uA 22.004 DISP [32] 5100B OUTPUT LO to UUT COM 22.005 HEAD AC MILLIAMP TESTS: {32mA Range} 22.006 5100 32 27.00mA 0.42U 50H 2W 23.001 HEAD AC MILLIAMP TESTS: {320mA Range} 23.002 5100 320 270.0mA 4.2U 50H 2W 24.001 HEAD {AC MICROAMP TEST} 24.002 DISP Select the AC uA Function. 24.003 HEAD AC MICROAMP TEST: {3200uA Range} 24.004 5100 3200 2700uA 42U 500H 2W 25.001 HEAD {DC MICROAMP TEST} 25.002 DISP Select the DC uA Function. 25.003 HEAD DC MICROAMP TEST: {3200uA Range} 25.004 5100 3200 2700uA 22U 2W 26.001 HEAD {DC MILLIAMP TESTS} 26.002 DISP Select the DC mA/A Function. 26.003 HEAD DC MILLIAMP TESTS: {32mA Range} 26.004 5100 32 27.00mA 0.22U 2W 27.001 DISP Disconnect the 5100B from the UUT. 27.002 HEAD {DC AMP TEST} 27.003 DISP Connect the 5220A and UUT as follows: 27.003 DISP [32] 5220A CURRENT OUTPUT HI to UUT A 27.003 DISP [32] 5220A CURRENT OUTPUT LO to UUT COM 27.004 HEAD DC AMP TEST: {10A Range} 27.005 5220 10 5.00A 0.06U 2W 28.001 HEAD {AC AMP TEST} 28.002 DISP Select the AC mA/A Function. 28.003 HEAD AC AMP TEST: {10A Range} 28.004 5220 10 5.00A 0.09U 1kH 2W 29.001 END